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<art><ui>1556-276X-7-384</ui><ji>1556-276X</ji><fm><dochead>Nano Express</dochead><bibl><title><p>Porous silicon/Ni composites of high coercivity due to magnetic field-assisted etching</p></title><aug><au id="A1" ca="yes"><snm>Granitzer</snm><fnm>Petra</fnm><insr iid="I1"/><email>petra.granitzer@uni-graz.at</email></au><au id="A2"><snm>Rumpf</snm><fnm>Klemens</fnm><insr iid="I1"/><email>klemens.rumpf@uni-graz.at</email></au><au id="A3"><snm>Ohta</snm><fnm>Toshiyuki</fnm><insr iid="I2"/><email>ohta@cc.tuat.ac.jp</email></au><au id="A4"><snm>Koshida</snm><fnm>Nobuyoshi</fnm><insr iid="I2"/><email>koshida@cc.tuat.ac.jp</email></au><au id="A5"><snm>Poelt</snm><fnm>Peter</fnm><insr iid="I3"/><email>peter.poelt@felm-zfe.at</email></au><au id="A6"><snm>Reissner</snm><fnm>Michael</fnm><insr iid="I4"/><email>reissner@ifp.tuwien.ac.at</email></au></aug><insg><ins id="I1"><p>Institute of Physics, Karl Franzens University Graz, Universitaetsplatz 5, Graz, A-8010, Austria</p></ins><ins id="I2"><p>Graduate School of Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Nakacho, Koganei, Tokyo, 184-8588, Japan</p></ins><ins id="I3"><p>Institute for Electron Microscopy, University of Technology Graz, Steyrergasse 17, Graz, A-8010, Austria</p></ins><ins id="I4"><p>Institute of Solid State Physics, Vienna University of Technology, Wiedner Hauptstr. 8, Vienna, A1040, Austria</p></ins></insg><source>Nanoscale Research Letters</source><issn>1556-276X</issn><pubdate>2012</pubdate><volume>7</volume><issue>1</issue><fpage>384</fpage><url>http://www.nanoscalereslett.com/content/7/1/384</url><xrefbib><pubidlist><pubid idtype="doi">10.1186/1556-276X-7-384</pubid><pubid idtype="pmpid">22784792</pubid></pubidlist></xrefbib></bibl><history><rec><date><day>30</day><month>4</month><year>2012</year></date></rec><acc><date><day>26</day><month>6</month><year>2012</year></date></acc><pub><date><day>11</day><month>7</month><year>2012</year></date></pub></history><cpyrt><year>2012</year><collab>Granitzer et al.; licensee Springer.</collab><note>This is an Open Access article distributed under the terms of the Creative Commons Attribution License (<url>http://creativecommons.org/licenses/by/2.0</url>), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.</note></cpyrt><kwdg><kwd>Magnetic field-assisted anodization</kwd><kwd>Porous silicon</kwd><kwd>Magnetic nanostructures</kwd><kwd>68.65.-k</kwd><kwd>75.75.-c</kwd><kwd>81.07.-b</kwd></kwdg><abs><sec><st><p>Abstract</p></st><p>Ferromagnetic nanostructures have been electrodeposited within the pores of porous silicon templates with average pore diameters between 25 and 60&#8201;nm. In this diameter regime, the pore formation in general is accompanied by dendritic growth resulting in rough pore walls, which involves metal deposits also offering a branched structure. These side branches influence the magnetic properties of the composite system not only due to modified and peculiar stray fields but also because of a reduced interpore spacing by the approaching of adjacent side pores. To improve the morphology of the porous silicon structures, a magnetic field up to 8&#8201;T has been applied during the formation process. The magnetic field etching results in smaller pore diameters with less dendritic side pores. Deposition of a ferromagnetic metal within these templates leads to less branched nanostructures and, thus, to an enhancement of the coercivity of the system and also to a significantly increased magnetic anisotropy. So magnetic field-assisted etching is an appropriate tool to improve the structure of the template concerning the decrease of the dendritic pore growth and to advance the magnetic properties of the composite material.</p></sec></abs></fm><bdy><sec><st><p>Background</p></st><p>In recent years, the demand on nanostructured materials increased enormously not only because of the miniaturization of devices but also because of the appearance of modified physical properties of nanosized objects compared to their bulk material. Nanostructures can be achieved by a top-down or bottom-up approach, whereas nanostructuring by self-organization is an emerging topic due to less costs, less time consumption and mostly a simple fabrication procedure.</p><p>Porous silicon can be formed with various morphologies <abbrgrp><abbr bid="B1">1</abbr></abbrgrp> exhibiting structures between a few nanometers and several tens of micrometers, and in its different natures, it is a versatile material for a broad range of applications in optics <abbrgrp><abbr bid="B2">2</abbr></abbrgrp>, acoustics <abbrgrp><abbr bid="B3">3</abbr></abbrgrp> and sensor technology <abbrgrp><abbr bid="B4">4</abbr></abbrgrp>, and in biomedicine, it is promising due to its biodegradability and biocompatibility <abbrgrp><abbr bid="B5">5</abbr></abbrgrp>. The possibility of achieving straight pores renders porous silicon a good template material for the deposition of various metals <abbrgrp><abbr bid="B6">6</abbr></abbrgrp>, whereas the case of merging ferromagnetic nanostructures with a semiconducting substrate results in a hybrid material, which offers the electronic properties of silicon and the nanomagnetic behavior of the precipitates. The deposition of the metals within the pores can be achieved electroless, electrochemically or by vapor transport methods such as atomic layer deposition or a form of chemical vapor deposition.</p><p>The fabrication of specimens with specific magnetic properties can be reached due to the possibility of modifying the geometry and the packing density of the precipitated metal nanostructures as well as of varying the morphology of the template <abbrgrp><abbr bid="B7">7</abbr></abbrgrp>. Considering the deposition of metal wires within the pores, a magnetic anisotropy between the two magnetization directions, with an applied field perpendicular (easy axis) and parallel (hard axis) to the surface, can be observed. The metal wires interact dipolarly not only within the pores but also between adjacent pores, depending on the pore distance. To enhance this anisotropy, the magnetostatic interactions between adjacent pores have to be decreased. Thus, the application of a magnetic field during the etching procedure has been employed to achieve smoother pore walls, leading also to smoother metal deposits, which results in a bigger effective distance between adjacent metal structures.</p></sec><sec><st><p>Methods</p></st><p>The conventionally etched porous silicon samples were prepared by anodization of highly n-doped silicon (10<sup>19</sup>/cm<sup>3</sup>) in aqueous/ethanoic acid solution at room temperature <abbrgrp><abbr bid="B8">8</abbr></abbrgrp>. To achieve average pore diameters of 60&#8201;nm, a current density of 100&#8201;mA/cm<sup>2</sup> has been applied. In this case, the pore formation is accompanied by the growth of small side pores exhibiting a length smaller than half of the pore distance, which ensures that the pores in general are not interconnected. Looking at a top-view scanning electron microscopy (SEM) image of a porous silicon specimen (Figure <figr fid="F1">1</figr>a), the mean pore distance is 50&#8201;nm, whereas the corresponding cross-sectional image shows that the effective mean distance between the pores is smaller (around 25&#8201;nm) due to the occurring side pores (Figure <figr fid="F1">1</figr>b).</p><fig id="F1"><title><p>Figure 1</p></title><caption><p>SEM images of a porous silicon specimen</p></caption><text>
   <p><b>SEM images of a porous silicon specimen.</b> ( <b>a</b>) Top-view micrograph showing pores with an average diameter of 60&#8201;nm and a mean distance between the pores of 50&#8201;nm. ( <b>b</b>) The cross-sectional image demonstrates that the effective mean pore distance is less than 50&#8201;nm due to the occurring side branches.</p>
</text><graphic file="1556-276X-7-384-1"/></fig><p>To improve the porous structure, which means to diminish the dendritic growth, a magnetic field of 8&#8201;T has been applied perpendicular to the sample surface during the anodization process. Furthermore, the temperature of the electrolyte has been kept at 0&#8201;&#176;C. The resulting morphology exhibits less and shorter side pores and a reduced pore diameter of about 25&#8201;nm (Figure <figr fid="F2">2</figr>).</p><fig id="F2"><title><p>Figure 2</p></title><caption><p>Magnetic field-assisted anodized specimen</p></caption><text>
   <p><b>Magnetic field-assisted anodized specimen.</b> ( <b>a</b>) Top-view SEM image of a magnetic field-assisted anodized specimen showing pores with an average diameter of 25&#8201;nm. ( <b>b</b>) Corresponding image of the cross-sectional region showing the less dendritic growth of the pores.</p>
</text><graphic file="1556-276X-7-384-2"/></fig><p>Both types of templates, conventionally etched and magnetic field-etched ones, have been filled with Ni electrochemically. As electrolyte, a solution consisting of NiCl<sub>2</sub>, NiSO<sub>4</sub> and H<sub>3</sub>BO<sub>3</sub> has been employed. The galvanic deposition has been performed in a pulsed way <abbrgrp><abbr bid="B9">9</abbr></abbrgrp>. In choosing a current density of 12&#8201;mA/cm<sup>2</sup> and a pulse frequency of 0.2&#8201;Hz, Ni-nanowires of a few micrometer in length were successfully embedded into the pores. The deposited Ni structures exhibit in all cases a wire-like structure with an aspect ratio up to 100. The precipitated Ni-wires within conventionally etched porous silicon offer roughness with a branched structure. In using the magnetic field-etched porous silicon as a template, the precipitated Ni-wires are smoother, and the mean distance between neighboring pores is increased up to 50&#8201;nm.</p><p>To investigate the prepared nanocomposite systems structurally, mainly SEM and EDX spectroscopy is used. Magnetic characterization has been carried out by SQUID magnetometry and a vibrating sample magnetometer.</p></sec><sec><st><p>Results and discussion</p></st><p>Considering the dissolution process of silicon, holes diffusing to the silicon/electrolyte interface attack the silicon atoms, but the motion of the holes cannot be controlled easily. The application of a magnetic field perpendicular to the sample surface during the anodization process controls this motion of the holes moving from the bulk silicon to the pore-tip region. In this case, the holes only reach the pore tips and do not diffuse any further to the pore walls. Holes moving in the growth direction of the pores contribute to the formation process, whereas holes with a direction that deviates from the growth direction feel the Lorentz force, which is induced by the applied magnetic field and do not contribute to the dissolution of the silicon. This experimental arrangement results in smaller pore diameters and smoother pore walls compared to conventional etching with adequate electrochemical parameters <abbrgrp><abbr bid="B10">10</abbr></abbrgrp>.</p><p>Electrodeposition of Ni within these less dendritic templates results also in smoother Ni-wires with less side pores. Thus, on the one hand, the geometry of the wires with less dendrites and, on the other hand, the resulting bigger distance between adjacent pores influence the magnetic properties of the composite system. Comparing the samples with deposited Ni-wires, in which the porous silicon was prepared by either conventional etching or by magnetic field-assisted etching, a significant modification of the magnetic properties was observed.</p><p>The magnetic behavior of samples anodized without magnetic field exhibits coercivities of <it>H</it><sub>C</sub>&#8201;=&#8201;270&#8201;Oe (measured at <it>T</it>&#8201;=&#8201;4&#8201;K) and 160&#8201;Oe (measured at <it>T</it>&#8201;=&#8201;250&#8201;K), whereas magnetic field-assisted anodized samples offer a more-than-doubled coercivity, <it>H</it><sub>C</sub>&#8201;=&#8201;660&#8201;Oe (measured at <it>T</it>&#8201;=&#8201;4&#8201;K) and <it>H</it><sub>C</sub>&#8201;=&#8201;540&#8201;Oe (measured at <it>T</it>&#8201;=&#8201;250&#8201;K) due to the reduction of magnetostatic coupling between adjacent pores, which increases the magnetization reversal field of the individual nanowire. Some values are summarized in Table <tblr tid="T1">1</tblr>. The achieved coercivity is still far less than the theoretically obtained value of the coercivity of a monocrystalline individual nanowire with <it>H</it><sub>C</sub>&#8201;=&#8201;3,400&#8201;Oe. Reasons for the reduction of the coercivity <it>H</it><sub>C</sub> are the still-occurring weak dipolar coupling between Ni-wires of adjacent pores, an imperfect cylindrical shape of the nanowires (due to the roughness of the pore walls) and, especially, the end of the wires showing an arbitrary geometry (not flat), which strongly influences the stray fields of the Ni-wires <abbrgrp><abbr bid="B11">11</abbr></abbrgrp>. Further enhancement of the coercivity to come closer to the theoretical value of a single wire could be reached by improving the nanowire growth (cylindrical shape with less roughness and monocrystallinity) and further decreasing the magnetostatic interactions between wires by increasing the distance between the pores.</p><table id="T1"><title><p>Table 1</p></title><caption><p><b>Magnetization data measured at</b> <b><it>T</it></b>&#8201; <b>=&#8201;4&#8201;K and</b> <b><it>T</it></b>&#8201; <b>=&#8201;250 K</b></p></caption><tgroup align="left" cols="5"><colspec align="left" colname="c1" colnum="1" colwidth="1*"/><colspec align="left" colname="c2" colnum="2" colwidth="1*"/><colspec align="left" colname="c3" colnum="3" colwidth="1*"/><colspec align="left" colname="c4" colnum="4" colwidth="1*"/><colspec align="left" colname="c5" colnum="5" colwidth="1*"/><thead valign="top"><row rowsep="1"><entry colname="c1"/><entry colname="c2"><p><b>Coercivity (Oe) magnetic field perpendicular to surface</b></p></entry><entry colname="c3"><p><b>Coercivity (Oe) magnetic field parallel to surface</b></p></entry><entry colname="c4"><p><b>Remanence M/M</b><sub><b>S</b></sub><b>(emu) magnetic field perpendicular to surface</b></p></entry><entry colname="c5"><p><b>Remanence M/M</b><sub><b>S</b></sub><b>(emu) magnetic field parallel to surface</b></p></entry></row></thead><tfoot><p>conv., samples prepared by conventional etching; mag., samples prepared by magnetic field-assisted etching.</p></tfoot><tbody valign="top"><row rowsep="1"><entry colname="c1"><p><it>T&#8201;=</it>&#8201;4&#8201;K (conv.)</p></entry><entry colname="c2"><p>270</p></entry><entry colname="c3"><p>180</p></entry><entry colname="c4"><p>0.42</p></entry><entry colname="c5"><p>0.36</p></entry></row><row rowsep="1"><entry colname="c1"><p><it>T</it>&#8201;=&#8201;100&#8201;K (conv.)</p></entry><entry colname="c2"><p>200</p></entry><entry colname="c3"><p>110</p></entry><entry colname="c4"><p>0.40</p></entry><entry colname="c5"><p>0.28</p></entry></row><row rowsep="1"><entry colname="c1"><p><it>T</it>&#8201;=&#8201;250&#8201;K (conv.)</p></entry><entry colname="c2"><p>160</p></entry><entry colname="c3"><p>75</p></entry><entry colname="c4"><p>0.38</p></entry><entry colname="c5"><p>0.22</p></entry></row><row rowsep="1"><entry colname="c1"><p><it>T</it>&#8201;=&#8201;4&#8201;K (mag.)</p></entry><entry colname="c2"><p>660</p></entry><entry colname="c3"><p>190</p></entry><entry colname="c4"><p>0.85</p></entry><entry colname="c5"><p>0.38</p></entry></row><row rowsep="1"><entry colname="c1"><p><it>T</it>&#8201;=&#8201;100&#8201;K (mag.)</p></entry><entry colname="c2"><p>570</p></entry><entry colname="c3"><p>125</p></entry><entry colname="c4"><p>0.81</p></entry><entry colname="c5"><p>0.34</p></entry></row><row rowsep="1"><entry colname="c1"><p><it>T</it>&#8201;=&#8201;250&#8201;K (mag.)</p></entry><entry colname="c2"><p>540</p></entry><entry colname="c3"><p>100</p></entry><entry colname="c4"><p>0.78</p></entry><entry colname="c5"><p>0.28</p></entry></row></tbody></tgroup></table></sec><sec><st><p>Conclusions</p></st><p>In the presented work, the modification of the magnetic properties of porous silicon/Ni nanocomposites caused by magnetic field-assisted pore formation is discussed. The high-aspect-ratio pores fabricated by anodization with an applied magnetic field offer a pore diameter smaller than 30&#8201;nm and a remarkable decreased growth of side pores. The deposition of Ni structures within these pores results in a more-than-doubled coercivity (increase from 270 to 650&#8201;Oe) and a doubled remanence (from 0.42 to 0.85&#8201;emu) of the nanocomposite compared to samples etched without magnetic field, whereas the aspect ratio of the deposited wires is comparable. The enhanced values can be attributed to the reduced magnetostatic interactions between Ni-wires deposited within neighboring pores, mainly caused by smoothened walls of the wires and an enhanced distance between the pores.</p></sec><sec><st><p>Competing interests</p></st><p>The authors declare that they have no competing interests.</p></sec><sec><st><p>Authors' contributions</p></st><p>PG performed the sample preparation by conventional anodization as well as the Ni-deposition into all templates. PG and KR carried out the magnetization measurements by SQUID and VSM. TO and NK performed the magnetic field-assisted anodization. PP carried out the SEM investigations. 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