Figure 2.

Experimental setup including the circuit connections with thermal management and electrical measurement systems. Experimental setup and circuit (a) and the corresponding circuit (right side) (b), equipped with thermal management and electrical measurement systems for thermal conductivity measurements via the 3-ω method at temperature ranges of 20 to 300 K.

Park et al. Nanoscale Research Letters 2014 9:96   doi:10.1186/1556-276X-9-96
Download authors' original image