Additional file 1.

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The video shows the modelling results achieved using Simwindows32 for sample AsN3134. Four graphs are constantly updated as the applied voltage is swept from 1 to −5 V. The x-axis represents the distance from the top of the device, measured in μm. Precisely: top left, evolution of the band diagram, measured in eV, the green and red lines are the hole and electron Fermi levels, respectively; top right, total recombination rate, this is the recombination rate minus the generation rate in the units of cm−3 s−1; bottom left, total electron (blue) and hole (red) concentrations in the units of cm-3; bottom right, charge distribution in the units of C/cm3.

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Royall et al. Nanoscale Research Letters 2014 9:84   doi:10.1186/1556-276X-9-84