Figure 1.

HRXRD results for the SrRuO3/SrTiO3 (001) substrate. (a) XRD θ to 2θ scan patterns. The left inset shows the rocking curve of the SrRuO3 (200)c peak. FWHM was as small as 0.057°. The right inset shows good oscillations at low angles due to the uniform thickness of about 38 nm. (b) X-ray reciprocal space mapping around the STO (114) plane showed well-developed peaks for SrRuO3 in the lower region and two strong substrate peaks in the upper region.

Lee et al. Nanoscale Research Letters 2014 9:8   doi:10.1186/1556-276X-9-8
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