Figure 3.

XRD and SAED. X-ray diffraction patterns of (a) sol–gel-derived ZnO thin film annealed at 750°C and (b) hexagonally patterned quasi-1D ZnO nanowire arrays. Both spectra show highly preferred c-axis growth. (c) and (d) are the electron diffraction patterns and HRTEM images of sol–gel-derived ZnO layer and ZnO nanowire, respectively.

Kuo and Lin Nanoscale Research Letters 2014 9:75   doi:10.1186/1556-276X-9-75
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