Figure 4.

Threshold field dependence on the aspect ratio of the Si pyramids. TF values obtained from the flat silicon substrate (AR = 0) from the present work as well as from literature are also included. The inset shows the SEM images of the MWCNT-coated Si pyramids for different AR values (the white scale bar is 2 μm).

Gautier et al. Nanoscale Research Letters 2014 9:55   doi:10.1186/1556-276X-9-55
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