Figure 6.

SEM images of the Si nanostructures and measured hemispherical reflectance spectra. Hemispherical reflectance spectra of the Si nanostructures fabricated using spin-coated Ag nanoparticles with different etching times of 5, 10, 20, and 30 min. The insets show the corresponding 45°-tilted-view SEM images.

Kim et al. Nanoscale Research Letters 2014 9:54   doi:10.1186/1556-276X-9-54
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