Figure 5.

SEM images of the Si nanostructures and measured the hemispherical reflectance spectra. Hemispherical reflectance spectra of the Si nanostructures fabricated under different Ar flow rates of 0, 5, 10, and 20 sccm. The insets show the corresponding SEM images with a 45°-tilted view.

Kim et al. Nanoscale Research Letters 2014 9:54   doi:10.1186/1556-276X-9-54
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