Figure 4.

SEM images of the Si nanostructures and the measured hemispherical reflectance spectra. Hemispherical reflectance spectra of the Si nanostructures fabricated under different RF powers of 25, 50, 75, and 100 W using spin-coated Ag nanoparticles as the etch mask. The insets show the corresponding 45°-tilted-view SEM images.

Kim et al. Nanoscale Research Letters 2014 9:54   doi:10.1186/1556-276X-9-54
Download authors' original image