Figure 3.

SEM images of the Si nanostructures and the measured hemispherical reflectance spectra. (a) Forty-five-degree-tilted-view SEM images and (b) hemispherical reflectance of the fabricated Si nanostructures corresponding to Ag ink ratios of 25%, 35%, and 50%.

Kim et al. Nanoscale Research Letters 2014 9:54   doi:10.1186/1556-276X-9-54
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