Calculated reflectance of Si nanostructures. Calculated (a) period- (i.e., distance between adjacent nanostructures) and (b) height-dependent reflectance of Si nanostructures as a function of wavelength when the height and period were fixed at 300 nm, respectively. (c) Calculated average reflectance as functions of period and height of the Si nanostructures in a wavelength range of 300 to 1,100 nm. The bottom diameter to period ratio and the top diameter to period ratio of the Si nanostructures used in the simulation were assumed as 0.8 and 0.15, respectively.
Kim et al. Nanoscale Research Letters 2014 9:54 doi:10.1186/1556-276X-9-54