Figure 7.

Retention characteristic and nondestructive readout properties. (a) Retention characteristic of the Zr/CeOx/Pt device. The resistance ratios between HRS/LRS are retained for more than 104 s. (b) Nondestructive readout properties of both HRS and LRS for 104 s.

Ismail et al. Nanoscale Research Letters 2014 9:45   doi:10.1186/1556-276X-9-45
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