Figure 1.

XRD pattern of the CeOxfilm and cross-sectional TEM and EDX images of the Zr/CeOx/Pt device. (a) XRD pattern of the CeOx film deposited on Si wafer at room temperature. (b) Cross-sectional TEM image of the Zr/CeOx/Pt device. (c) EDX image of the Zr/CeOx/Pt device.

Ismail et al. Nanoscale Research Letters 2014 9:45   doi:10.1186/1556-276X-9-45
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