Figure 2.

XRD patterns of TiO2 and SiO2 thin films fabricated on glass. XRD patterns showing that the TiO2 and SiO2 thin films fabricated on glass by E-beam evaporation with IAD exhibit a preferential amorphous growth.

Chiu et al. Nanoscale Research Letters 2014 9:35   doi:10.1186/1556-276X-9-35
Download authors' original image