Figure 3.

SEM images of thep-Sisubstrate and an EDX analysis of the In2S3 film.(a) Side-view and (b) top-view SEM images of the textured p-Si substrate, and (c) 50-nm, (d) 100-nm, and (e) 300-nm thick In2S3 films onto the textured p-Si. (f) EDX analysis of the In2S3 film, and the inset is a high-magnitude SEM image.

Hsiao et al. Nanoscale Research Letters 2014 9:32   doi:10.1186/1556-276X-9-32
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