Figure 3.

Porous Si SEM images used for the calculation of Hausdorff dimension. Examples of cross-sectional SEM images (a1) and top view images (b1) of the studied porous Si layer with their corresponding binary images (a2) and (b2), used for the calculation of the box counting dimension.

Valalaki and Nassiopoulou Nanoscale Research Letters 2014 9:318   doi:10.1186/1556-276X-9-318
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