Surface SEM image, EDS spectrum, and XRD pattern of a CIGS layer. The CIGS layer was deposited at a substrate temperature of 400°C for 3 min. (a) The surface SEM images of the CIGS layer, (b) the analysis results of the EDS spectrum of the CIGS nanoparticle at the position marked by a white cross in (a), and (c) the XRD pattern of the CIGS layer shown in (a).
Zhao et al. Nanoscale Research Letters 2014 9:308 doi:10.1186/1556-276X-9-308