Figure 1.

Structural and optical properties of a representative nc-Si:H sample withRH= 98.2%. (a) Experimental XRD spectrum showing diffraction peaks (111), (220), and (311). The inset shows the average grain sizes of the films under different RH. (b) The image of HRTEM with an inset of the SAED pattern. (c) Experimental (open circles) and fitted (solid curve) Raman spectrum with the inset presenting the crystalline volume fractions within the films under different RH. (d) Experimental (open circles) and fitted (solid curve) optical transmission spectrum.

Wen et al. Nanoscale Research Letters 2014 9:303   doi:10.1186/1556-276X-9-303
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