Open Access Nano Express

Simplified ZrTiO x -based RRAM cell structure with rectifying characteristics by integrating Ni/n + -Si diode

Chia-Chun Lin, Yung-Hsien Wu*, You-Tai Chang and Cherng-En Sun

Author Affiliations

Department of Engineering and System Science, National Tsing Hua University, Hsinchu 30013, Taiwan

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Nanoscale Research Letters 2014, 9:275  doi:10.1186/1556-276X-9-275

Published: 30 May 2014

Abstract

A simplified one-diode one-resistor (1D1R) resistive switching memory cell that uses only four layers of TaN/ZrTiOx/Ni/n+-Si was proposed to suppress sneak current where TaN/ZrTiOx/Ni can be regarded as a resistive-switching random access memory (RRAM) device while Ni/n+-Si acts as an Schottky diode. This is the first RRAM cell structure that employs metal/semiconductor Schottky diode for current rectifying. The 1D1R cell exhibits bipolar switching behavior with SET/RESET voltage close to 1 V without requiring a forming process. More importantly, the cell shows tight resistance distribution for different states, significantly rectifying characteristics with forward/reverse current ratio higher than 103 and a resistance ratio larger than 103 between two states. Furthermore, the cell also displays desirable reliability performance in terms of long data retention time of up to 104 s and robust endurance of 105 cycles. Based on the promising characteristics, the four-layer 1D1R structure holds the great potential for next-generation nonvolatile memory technology.

Keywords:
1D1R; Metal/semiconductor; Schottky diode; RRAM; Rectifying behavior; ZrTiOx; Retention; Endurance