Figure 2.

AFM image (a) and corresponding SKPM image (b) for surface of de-alloyed and then anodic oxidized Ti-Ni-Si specimen. Lower profiles of (a) and (b) are height from valley bottom and electrostatic potential for probe with 0 eV along red lines in upper images, respectively.

Fukuhara and Sugawara Nanoscale Research Letters 2014 9:253   doi:10.1186/1556-276X-9-253
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