Additional file 2.

SEM image of the 10-nm Ag film on 1-nm Ge interlayer deposited at RT on sapphire substrate. The 10-nm Ag film has the lowest, ever reported, surface roughness of RMS = 0.22 nm and ten-point height equal to 1.05 nm.

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Stefaniuk et al. Nanoscale Research Letters 2014 9:153   doi:10.1186/1556-276X-9-153