Figure 6.

Ten-point and average height values measured on 3 × 3 μm2 area on 10-nm Ag films. Thin films were deposited at temperatures in the range 200 to 350 K, and RMS values were measured using both AFM and XRR.

Stefaniuk et al. Nanoscale Research Letters 2014 9:153   doi:10.1186/1556-276X-9-153
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