Figure 4.

Three surface morphology parameters measured using AFM on 3 × 3 μm2 area of 30-nm-thick Ag layers. Thin Ag films were deposited on sapphire substrates with Ge wetting monolayer at temperatures in the range 170 to 400 K.

Stefaniuk et al. Nanoscale Research Letters 2014 9:153   doi:10.1186/1556-276X-9-153
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