X-ray powder diffraction pattern of the nanostructure sample grown at 506 ° C (black line). The pattern is assigned to Bi2Te2Se. The underlying red trace is the simulated pattern . The inset shows a TEM micrograph of a hexagonal platelet, which is typical for the studied powder sample.
Schönherr et al. Nanoscale Research Letters 2014 9:127 doi:10.1186/1556-276X-9-127