Electron micrographs of samples grown at various temperatures and their composition.(a) 480°C (left: 45° tilt-view SEM, right: TEM), (b) 506°C (top-view SEM), and (c) 545°C (side-view SEM). In the lattice-resolved TEM micrograph in (a), the indicated growth direction is along . The inset reveals an interplanar distance of 0.4 nm. In (b), mostly Bi2Te2Se platelets are observed, whereas at higher temperatures (c), the sample is composed of flakes as well as large Bi2Se3 wires.
Schönherr et al. Nanoscale Research Letters 2014 9:127 doi:10.1186/1556-276X-9-127