Figure 10.

Atomic force microscopy imaging and corresponding section analyses of irradiated part of samples. Atomic force microscopy imaging of irradiated part of graphene is shown at fluences (a) 1 × 1013, (c) 3 × 1013 and (e) 1 × 1014 ions/cm2, and corresponding section analyses is shown in (b), (d) and (f), respectively.

Kumar et al. Nanoscale Research Letters 2014 9:126   doi:10.1186/1556-276X-9-126
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