Cumulative probabilities of leakage currents and LRS/HRS and switching I-V curves of S1 and S2. (a) Cumulative probability of leakage currents for S1 and S2 devices with typical via size of 0.8 μm. Inset: leakage current vs. voltage characteristics. Switching I-V curves of (b) S2 and (c) S1 devices. The S2 device shows instability after a few cycles, while 10,000 consecutive switching cycles are observed for the S1 device. (d) Cumulative probability of LRS and HRS under Vread of ±1 V for the S1 devices.
Prakash et al. Nanoscale Research Letters 2014 9:125 doi:10.1186/1556-276X-9-125