Figure 3.

X-ray diffraction scans and Bi SIMS profiles. (004) X-ray diffraction ω/2θ transverse scans (a) and Bi SIMS profiles for the differently annealed samples (b).

Makhloufi et al. Nanoscale Research Letters 2014 9:123   doi:10.1186/1556-276X-9-123
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