Figure 1.

SIMS profiles and X-ray diffraction scans. SIMS profiles of the different elements (Ga, As, Bi) within the QW structure (a); (004) X-ray diffraction ω/2θ transverse scans measured (black) and simulated (orange) for the QW structure (b).

Makhloufi et al. Nanoscale Research Letters 2014 9:123   doi:10.1186/1556-276X-9-123
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