Figure 1.

Experimental arrangement. Mask design with transparent stripes (white) (a), sample configuration for laser processing (b), and experimental arrangement for mask projection and for the measurement of the beam profile in the sample plane (=mask image plane) (c).

Ihlemann and Weichenhain-Schriever Nanoscale Research Letters 2014 9:102   doi:10.1186/1556-276X-9-102
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