Table 1

Results of EBSD analysis of bulk Si and PS surfaces covered with Cu
Sample type Phase Percentage (%) Count Area (mm2) Orientation Lattice cell
Cu/Si (100) Not detected 15.9 437 0.03 None Unsolved points
Silicon 42.9 1,182 0.07 (100) Face-centered cubic system
Copper 28.2 778 0.05 (100) Face-centered cubic system
Cu2O 13.0 357 0.02 (100) Primitive cubic system
Cu/PS/Si (100) Not detected 41.9 1,436 0.08 None Unsolved points
Silicon 37.3 1,278 0.07 (100) Face-centered cubic system
Copper 20.3 695 0.04 (100) Face-centered cubic system
Cu2O 0.5 16 0.00 (100) Primitive cubic system
Cu/Si (111) Not detected 0.00 0 0.00 None Unsolved points
Silicon 64.3 2,140 0.12 (111) Face-centered cubic system
Copper 32.0 1,065 0.06 (111) Face-centered cubic system
Cu2O 3.8 125 0.01 (111) Primitive cubic system
Cu/PS/Si (111) Not detected 26.0 863 0.05 None Unsolved points
Silicon 49.5 1,642 0.10 (111) Face-centered cubic system
Copper 23.2 770 0.04 (111) Face-centered cubic system
Cu2O 1.3 42 0.00 (111) Primitive cubic system

Cu was deposited for 4 s from 0.025 M CuSO4ยท5H2O + 0.005 M HF aqueous solution.

Bandarenka et al.

Bandarenka et al. Nanoscale Research Letters 2013 8:85   doi:10.1186/1556-276X-8-85

Open Data