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Resolution: standard / high Figure 1.
SEM analysis of the surface of samples. (a) Cu/Si (100), (b) Cu/PS/Si (100), (c) Cu/Si (111), and (d) Cu/PS/Si (111).
Bandarenka et al. Nanoscale Research Letters 2013 8:85 doi:10.1186/1556-276X-8-85 |
