Figure 1.

SEM analysis of the surface of samples. (a) Cu/Si (100), (b) Cu/PS/Si (100), (c) Cu/Si (111), and (d) Cu/PS/Si (111).

Bandarenka et al. Nanoscale Research Letters 2013 8:85   doi:10.1186/1556-276X-8-85
Download authors' original image