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Resolution: standard / high Figure 6.
AFM images of (a, b) 5:10- and (c, d) 5:5-nm Al2O3/ZrO2films. (a, c) As-deposited. (b, d) After annealing.
Balakrishnan et al. Nanoscale Research Letters 2013 8:82 doi:10.1186/1556-276X-8-82 |
