AFM topography, KPFM scan, and comparison of height and CPD value profiles. AFM topography (a) and KPFM scan (b) of a pattern made in both polarizations: oxide (left) and graphitic (right) body contours are clearly resolved by CPD difference. Comparison of height profile and CPD value profile (five-point average along the black line) (c).
Lorenzoni et al. Nanoscale Research Letters 2013 8:75 doi:10.1186/1556-276X-8-75