John P George*, Jeroen Beeckman, Wouter Woestenborghs, Philippe F Smet, Wim Bogaerts and Kristiaan Neyts
* Corresponding author: John P George John.PuthenParampilGeorge@elis.ugent.be
Nanoscale Research Letters 2013, 8:62 doi:10.1186/1556-276X-8-62
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