Figure 3.

HRTEM imaging of the GaN/AlN/Si interface (a,b). Observation along the <a onClick="popup('http://www.nanoscalereslett.com/content/8/1/61/mathml/M8','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/8/1/61/mathml/M8">View MathML</a> zone axis showing the materials stacking.

Salomon et al. Nanoscale Research Letters 2013 8:61   doi:10.1186/1556-276X-8-61
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