Figure 1.

Optical microscope, SEM, and AFM images. (a) Optical microscope image of PyC thin film of 25-nm thickness deposited on silica substrate. (b) SEM image of the film surface area scraped by a blade. AFM image of the PyC film: (c) lateral position and (d) height profile of the PyC film. Optical image of the PyC deposited film on the quartz substrate is presented in (a). Scanning electron microscopy was done by SEM LEO - 1455 Vand and shows good homogeneity of PyC film (b). PyC thickness was controlled by AFM (Solver P47 PRO, NT-MDT). Corresponding AFM image of PyC film deposited on the substrate (the lateral position) is presented in (c). The height profile (the PyC film thickness) is presented in (d).

Kuzhir et al. Nanoscale Research Letters 2013 8:60   doi:10.1186/1556-276X-8-60
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