Table 1

The fitted parameters of the TM-doped TiO2 films determined by the SE spectra
Г (eV) EOBG (eV) ϵ A0 (eV3/2) df (nm) ds (nm) CTM (%)
Undoped 0.02 ± 0.01 3.58 ± 0.01 0.11 ± 0.03 136.6 ± 10 355 ± 10 5 ± 2
Dopant content
  Fe 0.01 0.030 ± 0.01 3.56 ± 0.02 0.260 ± 0.02 132.31 ± 12 288 ± 8 3 ± 1 0.8
0.03 0.085 ± 0.06 3.54 ± 0.02 0.087 ± 0.02 126.23 ± 20 265 ± 6 4 ± 2 2.7
  Ni 0.01 0.035 ± 0.02 3.53 ± 0.01 0.1 ± 0.04 134.48 ± 13 233 ± 7 3 ± 1 0.9
0.03 0.036 ± 0.03 3.50 ± 0.01 0.517 ± 0.11 128.18 ± 14 219 ± 6 3 ± 1 2.9
  Co 0.01 0.042 ± 0.01 3.48 ± 0.02 0.528 ± 0.10 125.11 ± 11 215 ± 5 3 ± 2 0.8
0.03 0.106 ± 0.04 3.43 ± 0.01 0.353 ± 0.15 118.9 ± 6 206 ± 5 4 ± 2 2.8

The film thickness (df), the thicknesses of the surface rough layer (ds), and the parameter value of Adachi's model (A0) for TM-doped TiO2 films with dopant content extracted from the simulation of SE in Figure 7. The 90% reliability of the fitted parameters is shown with ± sign. The TM atom composition CTM derived by the XPS spectra is also listed.

Tian et al.

Tian et al. Nanoscale Research Letters 2013 8:533   doi:10.1186/1556-276X-8-533

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