Copper composition in dealloyed NiCu thin films. Copper composition in the dealloyed films as a function of the composition in the as-deposited film. Each point represents a single sample, and the error bars are the typical EDS uncertainty. The dashed line indicates removal of both components at equal rates.
Koboski et al. Nanoscale Research Letters 2013 8:528 doi:10.1186/1556-276X-8-528