Figure 5.

Annealing temperature variation between 550°C to 850°C with 2-nm Au deposition for 30 s. (a) to (d) are AFM top views and (a-1) to (d-1) show AFM side views of 1 × 1 μm2 areas. (a-2) to (d-2) show the cross-sectional surface line profiles, (a-3) to (d-3) are the 2-D FFT power spectra, and (a-4) to (d-4) are the height distribution histograms.

Sui et al. Nanoscale Research Letters 2013 8:525   doi:10.1186/1556-276X-8-525
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