Figure 4.

XRD patterns (a) and SEM images (b, c, d, e, f, g) of samples collected at different reaction times. (a1, b) 220°C, 0 min; (a2, c) 250°C, 0 min; (a3, d) 270°C, 0 min; (a4, e) 270°C, 10 min; (a5, f) 270°C, 20 min; (a6, g) 270°C, 30 min. The inset in b is the corresponding TEM image.

Liu et al. Nanoscale Research Letters 2013 8:524   doi:10.1186/1556-276X-8-524
Download authors' original image