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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

Joe-Ming Chang1, Wei-Yu Chang2, Fu-Rong Chen2 and Fan-Gang Tseng123*

Author Affiliations

1 Institute of NanoEngineering and MicroSystems, Hsinchu 30013, Taiwan

2 Engineering and System Science Department, National Tsing Hua University, Hsinchu 30013, Taiwan

3 Applied Science Research Center, Academia Sinica, Taipei 11529, Taiwan

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Nanoscale Research Letters 2013, 8:519  doi:10.1186/1556-276X-8-519

Published: 7 December 2013

Additional files

Additional file 1:

f-d Curves, duration time, and schematic diagram. Figure S1. f-d curves obtained from a grounded metal surface before and after the measurement of the electrostatic field. Figure S2. the duration time of the charged sTNP tip under N2condition. Figure S3. f-d curves obtained from sTNP tip under N2 condition. Figure S4. schematic diagram of differences between experimental result and Ansoft Maxwell simulation. (Difference = Fele measured by EXP − Fele simulated by Ansoft Maxwell).

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