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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

Joe-Ming Chang1, Wei-Yu Chang2, Fu-Rong Chen2 and Fan-Gang Tseng123*

Author Affiliations

1 Institute of NanoEngineering and MicroSystems, Hsinchu 30013, Taiwan

2 Engineering and System Science Department, National Tsing Hua University, Hsinchu 30013, Taiwan

3 Applied Science Research Center, Academia Sinica, Taipei 11529, Taiwan

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Nanoscale Research Letters 2013, 8:519  doi:10.1186/1556-276X-8-519

Published: 7 December 2013

Abstract

A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN.

07.79.Lh, 81.16.-c, 84.37. + q

Keywords:
Electrostatic; Teflon; Nanoparticle; Atomic force microscopy