Figure 2.

FEM simulation with APT and simulated data of the lower QD. (a) Slice of the input data used in the FEM simulation included in the full domain considered (in nm), where isosurfaces of 30% In are shown in red (colour scale goes from 0% In to 30% In), (b) ϵzz calculated by FEM corresponding to the area of the APT data in the model of (a), and (c) strain line profiles along the surface of the barrier layer and along the lower QD (the green/red line marks the position of the minimum/maximum of the ϵzz profile).

Hernández-Saz et al. Nanoscale Research Letters 2013 8:513   doi:10.1186/1556-276X-8-513
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