Figure 6.

XPS Si 2p spectrum for the c (4 × 8) thin film grown on the Si (111) substrate. The open circles represent the experimental data and the thick solid line (red) overlapping them is the fit to the data. The right side peak can be decomposed into C1 and C2 components. The main component C1 comes from the contribution of Si substrate, while component C2 comes from the contribution of the iron silicide phase. The residual of the fit is shown by the lowermost solid line (black).

Zou et al. Nanoscale Research Letters 2013 8:510   doi:10.1186/1556-276X-8-510
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