Figure 1.

The Rietveld profile fitting of X-ray diffraction pattern of pure anatase TiO2 NPs. Experimental (symbols) and fitting (solid lines) X-ray diffraction patterns. The positions of Bragg reflections are denoted by vertical bars. The difference (experiment minus calculation) curve is shown by a solid line at the bottom.

Mohan et al. Nanoscale Research Letters 2013 8:503   doi:10.1186/1556-276X-8-503
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