SEM and TEM images of the synthesized Si NWs. (a) SEM image tilted by 30° and (b) cross-sectional SEM image of vertical Si NWs. (c) Typical low-magnitude TEM image and (d) HRTEM image of a Si NW. The inset of part (c) shows a SAED pattern of the NW. The inset SAED pattern is related with a crystal plane of the NW, and the NW growth direction spots express the  crystal planes. It indicates Si NW has  growth direction.
Kim et al. Nanoscale Research Letters 2013 8:502 doi:10.1186/1556-276X-8-502