SEM backscattered images of (a) CCTO, (b) CCTO/Au1, (c) CCTO/Au2, and (d) CCTO/Au3 samples; (e, f) EDS spectra of the CCTO/Au1 sample. The inset of (a) shows TEM image of Au NPs. (e, f) EDS spectra of the CCTO/Au1 sample detected at a bright particle on GB and a regular grain, respectively; insets of (e) and (f) show the testing EDS points, indicated by rectangular areas.
Tuichai et al. Nanoscale Research Letters 2013 8:494 doi:10.1186/1556-276X-8-494