SpringerOpen Newsletter

Receive periodic news and updates relating to SpringerOpen.

Download references

Open Access Open Badges

Stability scheme of ZnO-thin film resistive switching memory: influence of defects by controllable oxygen pressure ratio

Hsin-Wei Huang, Chen-Fang Kang, Fang-I Lai, Jr-Hau He, Su-Jien Lin and Yu-Lun Chueh*

Nanoscale Research Letters 2013, 8:483  doi:10.1186/1556-276X-8-483