Open Access Nano Express

Stability scheme of ZnO-thin film resistive switching memory: influence of defects by controllable oxygen pressure ratio

Hsin-Wei Huang, Chen-Fang Kang, Fang-I Lai, Jr-Hau He, Su-Jien Lin and Yu-Lun Chueh*

Nanoscale Research Letters 2013, 8:483  doi:10.1186/1556-276X-8-483

Article Metrics

971
Total accesses

Article metric FAQ

Accesses  

  • Last 30 days: 154 accesses
  • Last 365 days: 971 accesses
  • All time: 971 accesses

These numbers are accesses on SpringerOpen websites only, and an underestimate of total usage. More information